Investigation on Surface Hardness of Organic Nanoparticle Reinforced Polyetheretherketone Implant Material.

Abstract

Introduction: The durability of polyetheretherketone (PEEK) composites is reduced by the inadequacies of inorganic reinforcing elements, which include poor bonding and an inadequate interface between the matrix and the reinforcing material. In addition, being effective, PEEK matrix materials used in contemporary composites reinforced with plant-derived organic fibers should have sufficient surface hardness properties. This study aims to evaluate the surface hardness of organic (Azadirachta indica) nanoparticle-reinforced polyetheretherketone and its influence on dental implants.

Material and Method: This experiment measured surface hardness for mechanical behavior at the micro and nanoscale to investigate the effects of adding nano-reinforcement materials on performance using the Hysitron Nano Hardness Tester (TI 700 Ubi 1, Florida, USA) and Digital Microhardness Tester (HMV-2000, Shimadzu, Kyoto, Japan). The experiment comprises unreinforced PEEK as the control (NH and MH) and reinforced PEEK at 5, 10, 15, and 20 weight percentages as the experimental groups (NH 5%, 10%, 15%, 20% and MH 5%, 10%, 15%, 20%).

Results: Azadirachta indica nanoparticles added with PEEK exhibit an increase in nanohardness (P = 0.000) and no change in microhardness (P = 0.101). The study's nano hardness values fall between 200 and 330 MPa (megapascals) and the microhardness between 60 to 70 VHN. Among the evaluated organic PEEK-reinforced composites, NH 20% and MH 15% showed the highest nano and microhardness respectively.

Conclusion: The current study observed that the nano hardness is improved by adding 5%, 10%, 15%, and 20% Azadirachta indica leaf nanoparticles. The groups' microhardness levels did not appear to differ from one another. In preference to more expensive and environmentally dangerous synthetic nanoparticles, Azadirachta indica leaf nanoparticles can be used as an alternative reinforcement material when combined with PEEK.